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A. O. MustaphaCorresponding Author Contact Information, E-mail The Corresponding Author, a, J. P. Patela, I. V. S. Rathoreb, N. O. Hashimb and D. Otwomac, 1

a Department of Physics, University of Nairobi, P.O. Box 30197, Nairobi, Kenya

b Department of Physics, Kenyatta University, P.O. Box 43844, Nairobi, Kenya

c National Radiation Protection Laboratory, P.O. Box 19841, Nairobi, Kenya

Received 3 March 2003;

revised 13 June 2003;

accepted 29 September 2003. ;

Available online 12 December 2003.

 

Abstract

A NaI(Tl)-based gamma spectrometer for the analysis of geological materials was calibrated using the IAEA reference materials RGU-1, RGTH-1 and RGK-1. To simulate typical geological samples, two additional standards were prepared from aliquots of the three reference materials. The reproducibility of the instrument calibration factors (CFs) was tested by repeated measurements of the pure IAEA reference materials and the mixed samples in a reproducible counting geometry. The results were analysed using a two-way classification analysis of variance; it was found that the variance in the CFs is significantly higher between standards than it is between measurements. Allowance should be made for this when estimating uncertainties in measurements with the NaI(Tl) spectrometers.

 

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